Atomic-scale imaging of individual dopant atoms and clusters in highly n -type bulk Si PM Voyles, DA Muller, JL Grazul, PH Citrin, HJL Gossmann
Nature 416 (6883), 826-829, 2002
533 2002 H2 V3 O8 Nanowire/Graphene Electrodes for Aqueous Rechargeable Zinc Ion Batteries with High Rate Capability and Large Capacity Q Pang, C Sun, Y Yu, K Zhao, Z Zhang, PM Voyles, G Chen, Y Wei, ...
Advanced Energy Materials 8 (19), 1800144, 2018
466 2018 Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts AB Yankovich, B Berkels, W Dahmen, P Binev, SI Sanchez, SA Bradley, ...
Nature communications 5 (1), 4155, 2014
316 2014 Imaging individual atoms inside crystals with ADF-STEM PM Voyles, JL Grazul, DA Muller
Ultramicroscopy 96 (3-4), 251-273, 2003
289 2003 Stabilization of copper catalysts for liquid‐phase reactions by atomic layer deposition BJ O'Neill, DHK Jackson, AJ Crisci, CA Farberow, F Shi, AC Alba‐Rubio, ...
Angewandte Chemie 125 (51), 14053-14057, 2013
234 2013 Morphology and crystallization kinetics in thin films grown by atomic layer deposition MY Ho, H Gong, GD Wilk, BW Busch, ML Green, PM Voyles, DA Muller, ...
Journal of Applied Physics 93 (3), 1477-1481, 2003
223 2003 Nanoscale Structure and Structural Relaxation in Bulk Metallic Glass J Hwang, ZH Melgarejo, YE Kalay, I Kalay, MJ Kramer, DS Stone, ...
Physical review letters 108 (19), 195505, 2012
213 2012 Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB2 A Matsumoto, H Kumakura, H Kitaguchi, BJ Senkowicz, MC Jewell, ...
Applied physics letters 89 (13), 2006
177 2006 Fluctuation microscopy in the STEM PM Voyles, DA Muller
Ultramicroscopy 93 (2), 147-159, 2002
165 2002 Atom pair persistence in disordered materials from fluctuation microscopy JM Gibson, MMJ Treacy, PM Voyles
Ultramicroscopy 83 (3-4), 169-178, 2000
154 2000 High‐performance, quantum dot nanocomposites for nonlinear optical and optical gain applications MA Petruska, AV Malko, PM Voyles, VI Klimov
Advanced Materials 15 (7‐8), 610-613, 2003
153 2003 Total reaction and 2n -removal cross sections of 20–60A MeV , , and on Si RE Warner, RA Patty, PM Voyles, A Nadasen, FD Becchetti, JA Brown, ...
Physical Review C 54 (4), 1700, 1996
151 1996 Tm3 Fe5 O12 /Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications A Quindeau, CO Avci, W Liu, C Sun, M Mann, AS Tang, MC Onbasli, ...
Advanced Electronic Materials 3 (1), 1600376, 2017
147 2017 Fast flexible electronics with strained silicon nanomembranes H Zhou, JH Seo, DM Paskiewicz, Y Zhu, GK Celler, PM Voyles, W Zhou, ...
Scientific reports 3 (1), 1291, 2013
143 2013 Quantitative measurement of density in a shear band of metallic glass monitored along its propagation direction V Schmidt, H Rösner, M Peterlechner, G Wilde, PM Voyles
Physical review letters 115 (3), 035501, 2015
134 2015 Fluctuation microscopy: a probe of atomic correlations in disordered materials PM Voyles, JM Gibson, MMJ Treacy
Microscopy 49 (2), 259-266, 2000
132 2000 Influence of film composition in quaternary Heusler alloy Co2 (Mn, Fe) Si thin films on tunnelling magnetoresistance of Co2 (Mn, Fe) Si/MgO-based magnetic tunnel junctions H Liu, T Kawami, K Moges, T Uemura, M Yamamoto, F Shi, PM Voyles
Journal of Physics D: Applied Physics 48 (16), 164001, 2015
130 2015 Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy WG Stratton, J Hamann, JH Perepezko, PM Voyles, X Mao, SV Khare
Applied Physics Letters 86 (14), 2005
130 2005 Structure and physical properties of paracrystalline atomistic models of amorphous silicon PM Voyles, N Zotov, SM Nakhmanson, DA Drabold, JM Gibson, ...
Journal of Applied Physics 90 (9), 4437-4451, 2001
124 2001 Medium-range order in amorphous silicon measured by fluctuation electron microscopy PM Voyles, JR Abelson
Solar energy materials and solar cells 78 (1-4), 85-113, 2003
118 2003