| Characterization of dual-phase steel microstructure by combined submicrometer EBSD and EPMA carbon measurements PT Pinard, A Schwedt, A Ramazani, U Prahl, S Richter Microscopy and microanalysis 19 (4), 996-1006, 2013 | 100 | 2013 |
| Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering X Llovet, A Moy, PT Pinard, JH Fournelle Progress in Materials Science 120, 100818, 2021 | 96 | 2021 |
| Persulfate initiated ultra-low cross-linked poly (N-isopropylacrylamide) microgels possess an unusual inverted cross-linking structure OLJ Virtanen, A Mourran, PT Pinard, W Richtering Soft matter 12 (17), 3919-3928, 2016 | 78 | 2016 |
| Characterisation of microstructure and modelling of flow behaviour of bainite-aided dual-phase steel A Ramazani, PT Pinard, S Richter, A Schwedt, U Prahl Computational materials science 80, 134-141, 2013 | 76 | 2013 |
| Secondary fluorescence in electron probe microanalysis of material couples X Llovet, PT Pinard, JJ Donovan, F Salvat Journal of Physics D: Applied Physics 45 (22), 225301, 2012 | 67 | 2012 |
| Analysis of WC/Ni-based coatings deposited by controlled short-circuit MIG welding P Vespa, PT Pinard, R Gauvin, M Brochu Journal of materials engineering and performance 21, 865-876, 2012 | 41 | 2012 |
| Towards a more comprehensive microstructural analysis of Zr–2.5 Nb pressure tubing using image analysis and electron backscattered diffraction (EBSD) P Hovington, PT Pinard, M Lagacé, L Rodrigue, R Gauvin, ML Trudeau Journal of Nuclear Materials 393 (1), 162-174, 2009 | 33 | 2009 |
| Electron probe microanalysis of Ni silicides using Ni-L X-ray lines X Llovet, PT Pinard, E Heikinheimo, S Louhenkilpi, S Richter Microscopy and Microanalysis 22 (6), 1233-1243, 2016 | 28 | 2016 |
| Development and validation of standardless and standards-based X-ray microanalysis PT Pinard, A Protheroe, J Holland, S Burgess, PJ Statham IOP Conference Series: Materials Science and Engineering 891 (1), 012020, 2020 | 19 | 2020 |
| An open-source engine for the processing of electron backscatter patterns: EBSD-Image PT Pinard, M Lagacé, P Hovington, D Thibault, R Gauvin Microscopy and Microanalysis 17 (3), 374-385, 2011 | 18 | 2011 |
| Low voltage EPMA: experiments on a new frontier in microanalysis-analytical lateral resolution J Fournelle, H Cathey, PT Pinard, S Richter IOP Conference Series: Materials Science and Engineering 109 (1), 012003, 2016 | 15 | 2016 |
| Improving the quantification at high spatial resolution using a field emission electron microprobe PT Pinard, S Richter IOP Conference Series: Materials Science and Engineering 55 (1), 012016, 2014 | 14 | 2014 |
| Deformation behavior of high-manganese TWIP steels produced by twin-roll strip casting M Daamen, W Nessen, PT Pinard, S Richter, A Schwedt, G Hirt Procedia Engineering 81, 1535-1540, 2014 | 11 | 2014 |
| Electron probe microanalysis of carbon containing steels at a high spatial resolution PT Pinard, R Gauvin, JM Schneider, J Mayer Fachgruppe für Materialwissenschaft und Werkstofftechnik, 2017 | 9 | 2017 |
| PyPenelope PT Pinard, H Demers, F Salvat, R Gauvin Tech. Rep., Oct., 2016.[Online]. Available: https://pypenelope. sourceforge. net, 2006 | 9 | 2006 |
| Quantitative evaluation of metallographic preparation quality using EBSD PT Pinard, P Hovington, M Lagacé, GM Lucas, GV Voort, R Gauvin Microscopy and Microanalysis 15 (2), 778, 2009 | 8 | 2009 |
| Electron probe microanalysis of Ni-silicides at low voltage: difficulties and possibilities E Heikinheimo, PT Pinard, S Richter, X Llovet, S Louhenkilpi IOP Conference Series: Materials Science and Engineering 109 (1), 012005, 2016 | 7 | 2016 |
| Analytical challenges and strategies in FE-EPMA S Richter, PT Pinard Microscopy and Microanalysis 20 (S3), 680-681, 2014 | 7 | 2014 |
| Pymontecarlo: A common programming interface for running identical simulations using different Monte Carlo programs PT Pinard, H Demers, R Gauvin, S Richter Microscopy and Microanalysis 19 (S2), 822-823, 2013 | 7 | 2013 |
| X-ray microanalysis at high count rate with latest generation silicon drift energy dispersive spectrometer PT Pinard, S Burgess, JQ Zhang, J Holland, P Statham Microscopy and Microanalysis 24 (S1), 724-725, 2018 | 6 | 2018 |
