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Antonio Serra
Antonio Serra
Instituto Superior Tecnico, Universidade de Lisboa
Bestätigte E-Mail-Adresse bei tecnico.ulisboa.pt
Titel
Zitiert von
Zitiert von
Jahr
Automatic calibration of analog and digital measuring instruments using computer vision
EC Alegria, AC Serra
IEEE transactions on instrumentation and measurement 49 (1), 94-99, 2000
1862000
PQ monitoring system for real-time detection and classification of disturbances in a single-phase power system
T Radil, PM Ramos, FM Janeiro, AC Serra
IEEE Transactions on Instrumentation and Measurement 57 (8), 1725-1733, 2008
1482008
Cross-correlation and sine-fitting techniques for high-resolution ultrasonic ranging
R Queiros, FC Alegria, PS Girao, ACC Serra
IEEE Transactions on Instrumentation and Measurement 59 (12), 3227-3236, 2010
1322010
A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems
PM Ramos, AC Serra
Measurement 41 (2), 135-143, 2008
1272008
New spectrum leakage correction algorithm for frequency estimation of power system signals
T Radil, PM Ramos, AC Serra
IEEE Transactions on Instrumentation and Measurement 58 (5), 1670-1679, 2009
1112009
Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals
PM Ramos, MF da Silva, RC Martins, AMC Serra
IEEE Transactions on instrumentation and Measurement 55 (2), 646-651, 2006
992006
Low frequency impedance measurement using sine-fitting
PM Ramos, MF Da Silva, AC Serra
Measurement 35 (1), 89-96, 2004
852004
An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems
JMD Pereira, PMBS Girão, AMC Serra
IEEE Transactions on Instrumentation and Measurement 53 (2), 423-430, 2004
732004
Combined spectral and histogram analysis for fast ADC testing
AC Serra, MF da Silva, PM Ramos, RC Martins, L Michaeli, J Saliga
IEEE Transactions on Instrumentation and Measurement 54 (4), 1617-1623, 2005
722005
Automated ADC characterization using the histogram test stimulated by Gaussian noise
RC Martins, AMC Serra
IEEE Transactions on Instrumentation and Measurement 48 (2), 471-474, 1999
661999
A one‐dimensional, self‐consistent numerical solution of Schrödinger and Poisson equations
AMC Serra, HA Santos
Journal of applied physics 70 (5), 2734-2738, 1991
661991
Recent developments on impedance measurements with DSP-based ellipse-fitting algorithms
PM Ramos, FM Janeiro, M Tlemçani, AC Serra
IEEE Transactions on Instrumentation and Measurement 58 (5), 1680-1689, 2009
632009
Impedance measurement with sine-fitting algorithms implemented in a DSP portable device
T Radil, PM Ramos, AC Serra
IEEE Transactions on instrumentation and measurement 57 (1), 197-204, 2007
612007
Computer vision applied to the automatic calibration of measuring instruments
FC Alegria, AC Serra
Measurement 28 (3), 185-195, 2000
612000
Performance analysis of an ADC histogram test using small triangular waves
F Alegria, P Arpaia, AM da Cruz Serra, P Daponte
IEEE Transactions on Instrumentation and Measurement 51 (4), 723-729, 2002
592002
An ADC histogram test based on small-amplitude waves
FC Alegria, P Arpaia, P Daponte, AC Serra
Measurement 31 (4), 271-279, 2002
552002
A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
P Arpaia, AM da Cruz Serra, CL Monteiro
IEEE Transactions on Instrumentation and Measurement 50 (4), 941-948, 2001
542001
Comparison of frequency estimation algorithms for power quality assessment
PM Ramos, AC Serra
Measurement 42 (9), 1312-1317, 2009
532009
Automated power quality monitoring system for on-line detection and classification of disturbances
V Matz, T Radil, P Ramos, AC Serra
2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 1-6, 2007
482007
A new four parameter sine fitting technique
MF Da Silva, PM Ramos, AC Serra
Measurement 35 (2), 131-137, 2004
432004
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