High-performance Si microwire photovoltaics MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ... Energy & Environmental Science 4 (3), 866-871, 2011 | 242 | 2011 |
Effects of dispersion conditions of single-walled carbon nanotubes on the electrical characteristics of thin film network transistors SN Barman, MC LeMieux, J Baek, R Rivera, Z Bao ACS applied materials & interfaces 2 (9), 2672-2678, 2010 | 57 | 2010 |
Energy Environ. Sci. 4, 866 (2011) MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ... | 11 | |
Predicting congressional votes based on campaign finance data S Smith, JY Baek, Z Kang, D Song, L El Ghaoui, M Frank 2012 11th International Conference on Machine Learning and Applications 1 …, 2012 | 10 | 2012 |
Optimization of blended virtual and actual metrology schemes JYC Baek, CJ Spanos Metrology, Inspection, and Process Control for Microlithography XXVI 8324 …, 2012 | 10 | 2012 |
Optimal training and efficient model selection for parameterized large margin learning Y Zhou, JY Baek, D Li, CJ Spanos Advances in Knowledge Discovery and Data Mining: 20th Pacific-Asia …, 2016 | 8 | 2016 |
Real-time inspection system utilizing scatterometry pupil data JY Baek, P Leray, AL Charley, CJ Spanos Journal of Micro/Nanolithography, MEMS, and MOEMS 13 (4), 041403-041403, 2014 | 5 | 2014 |
Energy & Environ MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ... Sci 4, 866-871, 2011 | 5 | 2011 |
Enhancing metrology by combining spatial variability and global inference CJ Spanos, JY Baek Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013 | 3 | 2013 |
Performance Evaluation of Blended Metrology Schemes Incorporating Virtual Metrology JY Baek, CJ Spanos IEEE transactions on semiconductor manufacturing 26 (4), 506-515, 2013 | 2 | 2013 |
Pattern Analysis of Movement Behavior of Medaka (Oryzias latipes): A Decision Tree Approach S Lee, J Kim, JY Baek, MW Han, S Kim, TS Chon Computer Analysis of Images and Patterns: 11th International Conference …, 2005 | 2 | 2005 |
Modeling and Selection for Real-time Wafer-to-Wafer Fault Detection Applications JY Baek University of California, Berkeley, 2015 | 1 | 2015 |
Pattern Classification and Recognition of Movement Behavior of Medaka (Oryzias Latipes) Using Decision Tree S Lee, J Kim, JY Baek, MW Han, TS Chon International Conference on Fuzzy Systems and Knowledge Discovery, 186-195, 2005 | 1 | 2005 |
Movement Analysis of Medaka (Oryzias Latipes) for an Insecticide Using Decision Tree S Lee, J Kim, JY Baek, MW Han, CW Ji, TS Chon Discovery Science: 8th International Conference, DS 2005, Singapore, October …, 2005 | 1 | 2005 |
Detectability of Multiple Slice Breast Cone Beam Computed Tomography Images M Han, B Kim, J Baek MEDICAL PHYSICS 44 (6), 3141-3141, 2017 | | 2017 |
SU‐G‐IeP2‐01: A Method to Reduce Information Loss in JPEG Compressed Medical Images Using Richardson‐Lucy Deconvolution Y Choi, M Han, J Baek Medical Physics 43 (6Part26), 3655-3655, 2016 | | 2016 |
SU‐G‐IeP2‐08: Investigation On Signal Detectability in Volumetric Cone Beam CT Images with Anatomical Background M Han, J Baek Medical Physics 43 (6Part26), 3657-3657, 2016 | | 2016 |
2013 Index IEEE Transactions on Semiconductor Manufacturing Vol. 26 JY Baek, K Bandy, G Bano, H Bartolf, L Benfu, JP Bickford, J Blue, ... IEEE Transactions on Semiconductor Manufacturing 26 (4), 629, 2013 | | 2013 |
Effect of Periodic Virtual Metrology Recalibration on Blended Metrology Schemes JYC Baek | | 2012 |