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Ryan Robucci
Ryan Robucci
Bestätigte E-Mail-Adresse bei umbc.edu - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Compressive sensing on a CMOS separable-transform image sensor
R Robucci, JD Gray, LK Chiu, J Romberg, P Hasler
Proceedings of the IEEE 98 (6), 1089-1101, 2010
2292010
Compressive sensing on a CMOS separable transform image sensor
R Robucci, LK Chiu, J Gray, J Romberg, P Hasler, D Anderson
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE …, 2008
2292008
System and method for proximity-based position, movement and gesture detection using capacitive sensor arrays
R Robucci, N Banerjee
US Patent App. 14/523,347, 2015
81*2015
Matia: a programmable 80/spl mu/w/frame cmos block matrix transform imager architecture
A Bandyopadhyay, J Lee, RW Robucci, P Hasler
IEEE Journal of Solid-State Circuits 41 (3), 663-672, 2006
752006
Inviz: Low-power personalized gesture recognition using wearable textile capacitive sensor arrays
G Singh, A Nelson, R Robucci, C Patel, N Banerjee
Pervasive Computing and Communications (PerCom), 2015 IEEE International …, 2015
692015
Adaptive and Personalized Gesture Recognition Using Textile Capacitive Sensor Arrays
A Nelson, G Singh, R Robucci, C Patel, N Banerjee
Multi-Scale Computing Systems, IEEE Transactions on 1 (2), 62-75, 2015
522015
RAM: Radar-based activity monitor
MAAH Khan, R Kukkapalli, P Waradpande, S Kulandaivel, N Banerjee, ...
Computer Communications, IEEE INFOCOM 2016-The 35th Annual IEEE …, 2016
512016
A low-power, compact, adaptive logarithmic transimpedance amplifier operating over seven decades of current
A Basu, RW Robucci, PE Hasler
IEEE Transactions on Circuits and Systems I: Regular Papers 54 (10), 2167-2177, 2007
512007
Tongue-n-cheek: non-contact tongue gesture recognition
Z Li, R Robucci, N Banerjee, C Patel
Proceedings of the 14th International Conference on Information Processing …, 2015
392015
A 80 μW/frame 104× 128 CMOS imager front end for JPEG compression
A Bandyopadhyay, J Lee, R Robucci, P Hasler
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on …, 2005
312005
Event-Driven Low-Power Gesture Recognition Using Differential Capacitance
G Singh, A Nelson, S Lu, R Robucci, C Patel, N Banerjee
IEEE Sensors Journal 16 (12), 4955-4967, 2016
262016
Gait analysis for fall prediction using hierarchical textile-based capacitive sensor arrays
R Baldwin, S Bobovych, R Robucci, C Patel, N Banerjee
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 …, 2015
232015
RestEaZe: Low-power accurate sleep monitoring using a wearable multi-sensor ankle band
S Bobovych, F Sayeed, N Banerjee, R Robucci, RP Allen
Smart Health 16, 100113, 2020
222020
SunaPlayer: high-accuracy emulation of solar cells
S Bobovych, N Banerjee, R Robucci, JP Parkerson, J Schmandt, C Patel
Proceedings of the 14th International Conference on Information Processing …, 2015
212015
A resilient framework for sensor-based attacks on cyber–physical systems using trust-based consensus and self-triggered control
TA Severson, B Croteau, EJ Rodríguez-Seda, K Kiriakidis, R Robucci, ...
Control Engineering Practice 101, 104509, 2020
192020
Side-Channel Power Resistance for Encryption Algorithms Using Implementation Diversity
I Bow, N Bete, F Saqib, W Che, C Patel, R Robucci, C Chan, J Plusquellic
Cryptography 4 (2), 13, 2020
182020
Multilevel Longitudinal Analysis of Shooting Performance as a Function of Stress and Cardiovascular Responses
D Spangler, S Alam, S Rahman, J Crone, R Robucci, N Banerjee, ...
IEEE Transactions on Affective Computing, 2020
182020
The design and simulation model of an analog floating-gate computational element for use in large-scale analog reconfigurable systems
J Gray, R Robucci, P Hasler
Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on, 253-256, 2008
182008
Fiscal: Firmware identification using side-channel power analysis
D Krishnankutty, R Robucci, N Banerjee, C Patel
VLSI Test Symposium (VTS), 2017 IEEE 35th, 1-6, 2017
152017
Estimating Power Supply Noise and its impact on path delay
SK Rao, C Sathyanarayana, A Kallianpur, R Robucci, C Patel
VLSI Test Symposium (VTS), 2012 IEEE 30th, 276-281, 2012
152012
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