Noise-resilient SRAM physically unclonable function design for security S Pandey, S Deyati, A Singh, A Chatterjee 2016 IEEE 25th Asian Test Symposium (ATS), 55-60, 2016 | 26 | 2016 |
DFM-aware fault model and ATPG for intra-cell and inter-cell defects A Sinha, S Pandey, A Singhal, A Sanyal, A Schmaltz 2017 IEEE International Test Conference (ITC), 1-10, 2017 | 25 | 2017 |
Error resilient neuromorphic networks using checker neurons S Pandey, S Banerjee, A Chatterjee 2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018 | 10 | 2018 |
Sat-atpg generated multi-pattern scan tests for cell internal defects: Coverage analysis for resistive opens and shorts S Pandey, Z Liao, S Nandi, S Gupta, S Natarajan, A Sinha, A Singh, ... 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 7 | 2020 |
ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks S Pandey, S Banerjee, A Chatterjee 2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018 | 6 | 2018 |
Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology S Pandey, S Gupta, M Sudhan L., S Natarajan, A Sinha, A Chatterjee 2019 IEEE International Test Conference (ITC), 2019 | 5 | 2019 |
Cross-layer control adaptation for autonomous system resilience MI Momtaz, S Banerjee, S Pandey, J Abraham, A Chatterjee 2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018 | 5 | 2018 |
Concurrent error detection and tolerance in kalman filters using encoded state and statistical covariance checks S Pandey, S Banerjee, A Chatterjee 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System …, 2016 | 5 | 2016 |
Two pattern timing tests capturing defect-induced multi-gate delay impact of shorts S Pandey, Z Liao, S Nandi, S Natarajan, A Sinha, A Singh, A Chatterjee 2021 IEEE 39th VLSI Test Symposium (VTS), 1-7, 2021 | 3 | 2021 |
HIERARCHICAL TEST GENERATION FOR OPEN AND SHORT CIRCUITDEFECT EXPOSURE: A SYSTEMATIC METHODOLOGY S Pandey Georgia Institute of Technology, 2022 | | 2022 |